Applied Superconductivity Center

Facilities: Capabilities and Equipment

Fabrication and Heat-Treatment Laboratory Capability:

Thin-Film Deposition and Bulk Chemistry Lab, including laser ablation, ion beam and magnetron sputtering and clean room patterning facilities.

Mechanical Processing Lab - including Cold (CIP) and hot (HIP) isostatic presses, a hydrostatic extrusion press, billet welding and sealing, swaging, wire drawing and heat treatment facilities providing a complete in-house strand fabrication facility.

Full-scale hydraulic drawbench for wire drawing.

High resolution light metallography digital analysis system.

The center's hydrostatic extrusion press has 0.625" and 1.25" diameter chambers and a 300 ksi bore pressure

Electromagnetic Test Capability:

14-16T and 15-17 T Oxford Instruments magnets with Variable Temperature operation from 2 to 120 K

5.5 T Quantum Design SQUID magnetometer

Oxford Instruments 14 T Vibrating Sample Magnetometer with Cantilever Torque magne-tometer.

Quantum Design 9 T Physical Property Measurement System with DC and AC susceptibility and specific heat capability.

Very-Low-Field Shielded Test Facility
Extensive High-Sensitivity Electronics permitting nanovolt DC measurements.

Oxford Instruments 14 T Vibrating Sample Magnetometer with Cantilever Torque magne-tometer.

Magneto-optic imaging facility

	Magneto-Optic Imaging Facility
Matthew Feldmann demonstrates a portable version of the magneto-optic imaging facility to students at the University of Wisconsin-Madison, College of Engineering Expo'99.

Microstructural Evaluation Capability: (including adjacent Materials Science Center)

High-Resolution TEM (Phillips CM200UT with Ge EDS) *Dedicated analytical STEM (VG HB501) with EDS/EELS Field-Emission High Resolution SEM with Orientation Imaging Microscopy (LEO 1530, TSL/NORAN OIM) TEM/STEM (JEOL 200CX), SEMs (JEOL 6100) Well-Equipped TEM Sample Preparation Labs Field Emission Scanning Auger Microprobe (Phi 670) Secondary Ion Mass Spectrometer (SIMS) XPS/ESCA Spectrometer X-Ray Diffractometer with Parallel Detection, Hot Stage etc New W-Type Energy-Filtering TEM (LEO 912)
	Field-Emission High Resolution SEM with Orientation Imaging Microscopy (LEO 1530, TSL/NORAN OIM) and Noran Spectral Imaging software.

	High-Resolution TEM (Phillips CM200UT with Ge EDS)

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Created August 31,2005